Educational Activities Committee
Vice President of Educational Activities
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Meyya Meyyappan- Fellow
NASA Ames Research Center
Center for NanotechnologyMailstop 229-3
Moffett Field, CA 94035
USAPhone 1:
+1 650 604 2616Fax:
+1 650 604 5244Email 1:
m.meyyappan@nasa.govLecture Topics: 1. An Overview of Recent Developments in Nanotechnology 2. Nanomaterials for Nanoelectronics and Optoelectronics 3. Nanotechnology in Sensor Development
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Educational Activities Committee Members
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Fernando Guarin- Fellow
IBM Microelectronics
B-330C-1R23, Zip/20A2070 Route 52
Hopewell Junction, NY 12533
USAEmail 1:
guarinf@us.ibm.comLecture Topics: Reliability and scaling of CMOS, SiGe Reliability -
Agis A. Iliadis- Senior Member
University of Maryland
Electrical & Computer Eng. Dept.2373 A.V. Williams
College Park, MD 20742
USAPhone 1:
+1 301 405 3651Fax:
+1 301 314 9281Lecture Topics: Novel Electronic and Optoelectronic Devices using Metal Oxides on Si ZnO Nanosensors Surface Acoustic Wave Biosensors Electromagnetic interference in integrated circuits -
Sanghyun Ju
Kyonggi UniversityEmail 1:
shju@kgu.ac.kr -
Jeong-Soo Lee
Pohang University of Science and Technology (POSTECH)
Dept of Electrical EngineeringKoreaEmail 1:
ljs6951@postech.ac.kr -
Carmen Lilley
University of Illinois at Chicago3031 ERF (M/C 251)
Chicago, IllinoisUSAPhone 1:
312-413-7561Fax:
312-413-0447Email 1:
clilley@uic.edu -
Juin J. Liou- Fellow
University of Central Florida
School of EE and CS4000 Central Florida Blvd.
Orlando, FL 32816
USAPhone 1:
+1 407 823 5339Fax:
+1 407 823 5835Email 1:
liou@eecs.ucf.eduLecture Topics: Electrostatic Discharge Protection of Integrated Circuits -
Ming Liu- Senior Member
Director - Lab of Nano-fabrication and Novel Device Integration Technology
Institute of Microelectronics, CASNo.3, Bei-Tu-Cheng West Road
Beijing 100029
ChinaPhone 1:
86-10-82995578Fax:
86-10-82995583Email 1:
liuming@ime.ac.cnLecture Topics: nano-fabrication, advanced memory device (charge trap memory, nanocrystal floating gate and resistive switching memory device), nano-electronic device and integrated technology, molecular electronic device and its integration -
Adelmo Ortiz-Conde- Senior Member
Universidad Simon Bolivar
Dpto. de ElectronicaApartado Postal 89000
Caracas 1080
VenezuelaPhone 1:
+58-212-9064010Fax:
+58-212-9064025Lecture Topics: MOSFET threshold voltage extraction methods Compact models of Double-Gate MOSFETs Evolution of MOSFETs toward nanoelectronics Integration-based Methods for Device Parameter Extraction and Distortion Evaluation Modeling and Characterization of Diodes and Solar Cells Application of Lambertâ -
Sean Rommel
Rochester Institute of Technology82 Lomb Memorial Drive
Rochester, NY 14623-5604
USAEmail 1:
slremc@rit.edu -
Arunkumar Subramanian

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Jacobus W. Swart- Senior Member
FEEC/UNICAMP - State University of CampinasAv. Albert Einstein 400
Campinas, Sao Paul 13.083-970
BrazilPhone 1:
+55 19 3746 6001Lecture Topics: MEMS, sensors, ISFET, CNT and graphene, Advanced CMOS processes -
Dorota Temple
RTI International
Associate Director, Center for Materials & Elec.Tech.3021 Cornwallis Rd., MCNC Campus Bldg. 1
Research Triangle Park, NC 27709
USAPhone 1:
+1 919 248 1945Fax:
+1 919 248 1455Email 1:
temple@rti.org -
Ravi M. Todi- Fellow
Lecture Topics: Looking Beyond Conventional Scaling, High Performance SOI eDRAM -
Mani Vaidyanathan

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Albert Z.H. Wang- Fellow
University of California
Dept. of Electrical EngineeringOffice: 417 EBU2, Lab: 227 EBU2
Riverside, CA 92521
USAPhone 1:
+1 951 827 2555Fax:
+1 951 827 2425Email 1:
aw@ee.ucr.eduLecture Topics:
1. ESD-RFIC co-design techniques.
2. Mixed-mode ESD protection circuit simulation design methodology.
3. Above-IC ESD protection by nano technology
4. Field-programmable ESD protection by nano technology -
Xing Zhou- Senior Member
Nanyang Technological University
School of Electrical & Electronic Eng.Block S1, Nanyang Avenue, Office S1-B1c-95
Singapore 639798
SingaporePhone 1:
+65 6790 4532Fax:
+65 6793 3318Email 1:
exzhou@ntu.edu.sgLecture Topics:
"Unification of MOS Compact Models with the Unified Regional Modeling Approach"
"Compact Model Application to Statistical Variability and Reliability Studies" "A Unified Compact Model for Generic Heterostructure HEMTs"
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