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Stewart Rauch

 

rauch

Stewart Rauch
s.rauch@ieee.org


Stewart Rauch is currently a faculty member at State University of New York, New Paltz. He recently retired as Senior Technical Staff Member at IBM Semiconductor Research and Development Center (NY), specializing in hot carrier, bias temperature instability, and soft error reliability of state of the art CMOS technologies. He is a Senior Member of IEEE, a Life Member and Distinguished Lecturer of the Electron Devices Society, and frequent journal reviewer for such publications as the IEEE Transactions on Electron Devices and the Microelectronics Reliability journals, etc.