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Membership Committee

  • Vice President of Membership and Services

    • Tian-Ling Ren
       - Senior Member
      Tsinghua University
      Institute of Microelectronics
      Beijing 100084
      China
      Phone 1:
      +86 10 6278 9151

      Phone 2
      Ext. 311

      Lecture Topics: New Material Based Micro/Nano Devices Flexible Electronics Novel Acoustic and RF Devices Non-volatile Memory


      Biography: Tian-Ling Ren received his Ph.D. degree in solid-state physics from Department of Modern Applied Physics, Tsinghua University, China in 1997.


      He is full professor of Institute of Microelectronics, Tsinghua University since 2003. He has been a visiting professor at Electrical Engineering Department, Stanford University from 2011 to 2012.


      For these years, Prof. Ren’s research mainly focused on novel micro/nano electronic devices and key technologies, including nonvolatile memories (RRAM, FeRAM), RF devices (resonator, inductor), sensors, and MEMS. Prof. Ren’s main contributions are that he has developed the new integration methods for novel material based micro/nano device and circuit applications. For examples, he proposed the RRAM structure with integration of single layer graphene, which can drastically decrease the power consumption of the device; he developed the ferroelectric thin film based integrated acoustic devices; he also proposed the graphene sound source devices for the first time; and he realized the high quality ultra-flexible structured RF resonators with very promising applications. He has published more than 300 journal and conference papers. He has more than 40 patents.


      He has been an Elected Member at Large, and Distinguished Lecturer of IEEE Electron Devices Society. He is also Council Member of Chinese Society of Micro/Nano Technology. For these years, Prof. Ren has been the technical committee member for several leading international conferences, including International Electron Device Meeting (IEDM), and Device Research Meeting (DRC). He is also editorial board member of Scientific Reports (Nature Publishing Group).

  • Membership Committee Members

    • Chih-Hung (James) Chen
      McMaster University
      Associate Professor, Electrical and Computer Engineering
      ITB-A321 McMaster University
      1280 Main Street West
      Hamilton, Ontario L8S 4K1
      Canada
      Phone 1:
      +1 905 525 9140 Ext. 27084

      Fax:
      +1 905 521 2922
    • Fernando Guarin
       - Fellow
      Global Foundries
      Lecture Topics: Reliability and scaling of CMOS, SiGe Reliability  
    • Subramanian Iyer
       - Fellow
      Distinguished Chancellors Professor and IBM Fellow
      Electrical Engineering Department
      UCLA
      CA 90024
      USA
      Work:
      310 825 6913

      Cell:
      914 329 3341

      Lecture Topics: Orthogonal Scaling, embededed Memory, system scaling, 3D integration, semiconductors
    • Shankar N. Ekkanath Madathil
       - Solid State Power Devices
      University of Sheffield
      Rolls Royce and Royal Academy of Engineering, Electronics and Electric Engineering
      Mappin Street
      Sheffield S1 3JD
      UK
      Phone 1:
      44 114 222 5856

      Ekkanath Madathil Sankara Narayanan (M’87–SM’00) was born in India, in 1962. He received his B.Sc. and M.Sc. degrees from PSG College of Technology, Coimbatore, India, M.Tech degree from the Indian Institute of Science, Bangalore and his Ph.D. degree from the University of Cambridge, U.K. He was a Maudslay Engineering Research Fellow in Pembroke College, Cambridge and a Research Associate with Engineering Department, Cambridge University during 1992–1994. He was the Director of the Emerging Technologies Research Center, De Montfort University, UK during 1994–2007. He is currently with the Electrical Machines and Drives Research Group at the University of Sheffield in the UK, where he holds the Rolls Royce/Royal Academy of Engineering Chair in Power Electronics Systems and Royal Society Industry Fellowship in Rolls-Royce, UK. His research interests include integrated and discrete power device technologies in Silicon and wide band gap materials, design for manufacturability and compact power converters for automotive/aerospace applications, functional materials, thin film transistors, RF technologies, and technology strategies in microelectronics. He is an author of more than 200 articles and holds twenty five patents, approved or pending approval. He is a Fellow of IET and IOP. He is in the editorial boards of IEEE Transactions on Devices and Materials Reliability and IET Journal of Power Electronics.

    • M.K. Radhakrishnan
       - Senior Member
      NanoRel Technical Consultants
      273, 18D Main, 6th Block
      Koramangla, Bangalore 560095
      India
      Phone 1:
      +91 80 25630695

      Phone 2
      +91 9447663869

      Lecture Topics: 1. Physical Analysis Challenges and Interface Physics Studies in Silicon Nano Devices 2.  Building in Reliability in Devices through Analysis and Study of Failure Mechanisms.


      Biography:  M.K. Radhakrishnan (M’82-SM’94) received B.Sc from Kerala University, India in 1972, M.Sc in Solid State electronics from Sardar Patel University, India in 1975 and Ph.Ddegree in Semiconductor Physics from Cochin University of Science and Technology in 1981.


      He is currently Directorof NanoRel Technical Consultants Singapore from 2004.  He has been with Indian Space Research Organization till 1990. From 1991-1993 he was with ST Microelectronics Singapore. From 1993 to 2001 he was with Institute of Microelectronics Singapore, where he pioneered the setting up of a full-fledged device failure analysis laboratory.  From 1994 to 2004 he served as adjunct professor at National University of Singapore. His current research interests include analysis and reliability in nano-electronic devices and interface physics studies.


      Dr. Radhakrishnan is a fellow of Institution of Electrical and Telecommunication Engineers India, member of Electron Device Failure Analysis Society (EDFAS) USA and ESD Association USA.  He served as Editor of Journal of Semiconductor Technology and Science (Korea) during 2001-2003 and is an Editorial board member of Microelectronics Reliability journal (UK). He served as Guest Editor to IEEE Transactions Devices Materials and Reliability and edited or co-edited of 4 conference proceedings.  He was Technical Chair IEEE International Symposium on Physical and Failure Analysis of ICs (IPFA) in 1995 and 1997 and General Chair of IPFA in 1999.  He was IEEEIEDST General Chair in 2009. He has been in the technical program committees of ESREF, IRPS, EPTC, MIEL, ICEE and EOS/ESD Symposium.  Currently he is the Editor-in Chief of IEEE EDS Newsletter and serves as a member of IEEE EDS Technical Committee on Electronic Materials.  He is a Distinguished Lecturer of IEEE Electron Devices Society.


       

    • Samar K. Saha
       - Senior Member
      Prospicient Devices
      Milpitas, CA 95035
      USA
      Phone 1:
      +1 408 966 5805

      Lecture Topics: (1) Compact Variability Modeling; (2) Scaling Flash Memory Cell to Nanometer Regime; (3) High-performance and Ultra-low Power CMOS Device and Technology