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Adelmo Ortiz-Conde

Silicon and Column IV Semiconductor Devices
Thin Film Transistors

adelmo

Universidad Simon Bolivar
Dpto de Electronica
Apartado Postal 89000
Caracas 1080
Venezuela
Phone: 58 212 906 4010
   Fax:  58 212 906 4025
E-Mail: ortizc@ieee.org

Adelmo Ortiz-Conde (S’82, M'85, SM'97) was born in Caracas, Venezuela, on November 28, 1956. He received the professional Electronics Engineer degree from Universidad Simón Bolívar (USB), Caracas, Venezuela, in 1979 and the M.E. and Ph.D. from the University of Florida, Gainesville, in 1982 and 1985, respectively. His doctoral research, under the guidance of Prof. J. G. Fossum, was on the Effects of Grain Boundaries in SOI MOSFET’s.

From 1979 to 1980, he served as an instructor in the Electronics Department at USB. In 1985, he joined the technical Staff of Bell Laboratories, Reading, PA, where he was engaged in the development of high voltage integrated circuits. Since 1987 he returned to the Electronics Department at USB where he was promoted to Full Professor in 1995.  He was on sabbatical leave at Florida International University, Miami, from September to December 1993, and at University of Central Florida (UCF), Orlando, from January to August 1994, and again from July to December 1998. He also was on sabbatical leave at “Centro de Investigaciones y Estudios Avanzados” (CINVESTAV) National Polytechnic Institute (IPN), Mexico City, Mexico, from October 2000 to February 2001.

He has coauthored one textbook, Analysis and Design of MOSFETs: Modeling, Simulation and Parameter Extraction (Springer, 1998, ISBN: 978-0-412-14601-5), over 150 international technical journal and conference articles (including 15 invited review articles). His present research interests include the modeling and parameter extraction of semiconductor devices.

Dr. Ortiz-Conde is an EDS Distinguished Lecturer and the Chair of IEEE’s CAS/ED Venezuelan Chapter. He was the Region 9 Editor of IEEE EDS Newsletter from 2000 to 2005. He is a Member of the Editorial Advisory Board of various technical journals: Microelectronics and Reliability, “Universidad Ciencia y Tecnología” and “Revista Ingeniería UC”. He regularly serves as reviewer of several international journals, including IEEE Transactions on Electron Devices, IEEE Electron Device Letters, IEEE Transactions on Circuits and Systems I, Electronics Letters, Microelectronics Reliability, Solid State Electronics, Solar Energy Materials and Solar Cells, Semiconductor Science and Technology, Microelectronics Journal, Applied Energy, and Journal of Applied Physics. He has been a member of the Technical Program Committees of a variety of international conferences: Microelectronics Conference (MIEL), International Conference on Solid-State and Integrated-Circuit Technology (ICSICT), Symposium on Microelectronics Technology and Devices (SBMICRO),  Design of Circuits and Integrated Systems Conference (DCIS), Latin American Symposium on Circuits and Systems (LASCAS),  and IEEE ANDESCON. He was the General Chairperson of the first IEEE International Caribbean Conference on Devices, Circuits, and Systems (ICCDCS) in 1995, Technical Chairperson of the second, fourth and fifth editions of this conference in 1998, 2002 and 2004  respectively, and the Chairperson of the Steering Committee in 2000.