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Yuan Chen

Editor

ychen

NASA LaRC
Electronic Systems Branch
5 N. Dryden Steet MS 488
Hampton VA 23681
Phone: 1+ 757 864 3344
    Fax: 1+ 757 864 7944
Email: yuan.chen@nasa.gov

Yuan Chen received her Ph.D. degree in reliability engineering from the University of Maryland at College Park, Maryland, in 1998, with a Graduate Fellowship from the National Institute of Standards and Technologies.  From 1999 to 2002, she was a member of technical staff at Bell Labs, Lucent Technologies, and worked on gate oxide reliability, device and circuit reliability, burn-in modeling, and process and technology qualifications. From 2002 to 2009, she was a senior technical member with Electronic Parts Engineering Office, Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California.  She is currently a senior member of technical staff with the Electronic Systems Branch, NASA Langley Research Center, Hampton, Virginia, where she is leading the EEE parts engineering efforts at the program level for NASA Constellation Program. Her research area has been focused on product reliability and qualification methodologies, reliability of the extreme environments technologies, and development of reliability characterization and methodologies on microelectronic devices/circuits for space applications.  She has authored and co-authored over 40 technical papers. She has been on the management committee and technical review committee for the IEEE International Reliability and Physics Symposium (IRPS) and IEEE International Integrated Reliability Workshop (IIRW), serving as the general chair for IIRW in 2007.