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Peter J. S. Yuan

Editor

yuan

University of Central Florida
School of Electrical Engineering
and Computer Science
Orlando FL 32816
 Phone: +1 407 823 5719
     Fax: +1 407 823 5835
E-Mail: yuanj@pegasus.cc.ucf.edu
http://master.engr.ucf.edu/yuan/yuan.html

Peter J.S. Yuan received both the M.S. and Ph.D. degrees (1984 and 1988) from the University of Florida. He joined the faculty at the University of Central Florida in 1990 after one year of industrial experience at Texas Instruments, Inc., where he was involved with the 16-MB CMOS DRAM design. Currently, he is a professor and director of the Chip Design and Reliability Laboratory at the School of Electrical Engineering and Computer Science at UCF.

Dr. Yuan has published more 130 papers in referred journals and conference proceedings in the area of semiconductor devices and circuits. He has authored the book Semiconductor Device Physics and Simulation, published by Plenum in 1998 and the book SiGe, GaAs, and InP Heterojunction Bipolar Transistors published by Wiley in 1999. Since 1990, he has conducted many research projects funded by NSF, Motorola, Harris, Lucent Technologies, National Semiconductor, and Theses Logic. He serves regularly as a reviewer for the IEEE Transactions on Electron Devices, IEEE Electron Device Letters, and Solid-State Electronics. He has received many awards. These include the Distinguished Researcher Award, UCF, 1993 and 1996, Outstanding Engineering Educator Award, IEEE Orlando Section and Florida Council, 1993, and TIP award, UCF, 1995. He is listed in Who's Who in American Education and Who's Who in Science and Engineering.

Dr. Yuan is a senior member of IEEE and member of Eta Kappa Nu and Tau Beta Pi. He is currently the associate editor of the International Journal of Modeling and Simulation, an editor of the IEEE Transactions on Device and Materials Reliability and the past Chairman of the Electron Devices Chapter in the IEEE Orlando Section.

Dr. Walls is a Senior Member of the IEEE Electron Devices Society.