Felice Crupi

 crupiUniversity of Calabria

DEIS Via P. Bucci, 42C
Arcavacata di Rende Cosenza 87036
Phone: 39 0984 494766 
Fax: 39 0984 494834 

Felice Crupi received the M.S. degree in electronic engineering from the University of Messina, Messina, Italy, in 1997 and the Ph.D. degree from the University of Firenze, Firenze, Italy, in 2001.

Since 2002, he has been with the Dipartimento di Elettronica, Informatica e Sistemistica, Universit√† della Calabria, Rende, Italy, as an Associate Professor of electronics. Since 1998, he has been a repeat Visiting Scientist with the Interuniversity Micro-Electronics Center (IMEC), Leuven, Belgium. In 2000, he was a Visiting Scientist with the IBM Thomas J. Watson Research Center, Yorktown Heights, NY. His main research interests include reliability of CMOS devices, modeling and simulation of CMOS devices, electrical characterization techniques for solid state electronic devices, the design of ultra‚ÄĎlow noise electronic instrumentation and the design of extremely low power CMOS circuits. He has authored and co-authored more than 80 papers published in peer-reviewed journals and more than 50 papers published in international conference proceedings. He serves or served as a technical program committee member of the IEEE International Electron Devices Meeting (IEDM), and the IEEE International Reliability Physics Symposium (IRPS). He has been the Coordinator of international research projects in the field of semiconductor devices and circuits.