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Jiann-Shiun Yuan Distinguished Lecture
- Lecture
- Reliability and Characterization of GaN Power Devices
- Date
- 2019-05-19
- Location
- Kyoto Institute of Technology Kyoto Japan
- Region
- IEEE Region 10 (Asia and Pacific)
- Contact
- Hiroyuki Nishinaka – nisinaka@kit.ac.jp
- Presenter
