Cher Ming Tan


Nanyang Technological University
School of EEE
Block S2
B2C-99 Nanyang Avenue
Singapore 639798
Phone: 65 790 4567
    Fax: 65 792 0415




Dr. Tan received his Ph.D in Electrical Engineering from the University of Toronto in 1992.  He has 10 years of working experiences in reliability in electronic industry (both Singapore and Taiwan) before joining Nanyang Technological University (NTU) as faculty member in 1996 till now.  He has published more than 200 International Journal and Conference papers, and holding 8 patents and 1 copyright for reliability software.  He has given 2 keynote talks and many invited talks in International Conferences.  He has written 3 books and 3 book chapters in the field of reliability.  He is also the Series Editor of SpringerBrief in Reliability.

He is the past chair of IEEE Singapore Section, Senior member of IEEE and ASQ, Distinguish Lecturer of IEEE Electronic Device Society on reliability, Founding Chair of IEEE Nanotechnology Chapter - Singapore Section, Fellow of Institute of Engineers, Singapore, Fellow of Singapore Quality Institute, Executive Council member of Singapore Quality Institute, Director of SIMTech-NTU Reliability Lab, and Senior Scientist in SIMTech.  He is also the Founding Chair of IEEE International Conference on Nanoelectronics, General Co-Chair of International Symposium of Integrated Circuits 2007 and 2009.  He is also the recipient of IEEE Region 10 Outstanding Volunteer Award in 2011.  He is the Associated Editor of International Journal on Computing, and Guest Editor of International J. of Nanotechnology, Nano-research letter and Microelectronic Reliability.  He is in the reviewer board of several International Journals such as Thin Solid Film, Microelectronic Reliability, Microelectronics Engineering etc for more than 10 years.     He is also current active in providing consultation to multi-national corporations on reliability.

His research interests include reliability and failure physics modeling of electronic components and systems, finite element modeling of materials degradation, statistical modeling of engineering systems, nano-materials and devices reliability, and prognosis & health management of engineering system.