Open Journal on Immersive Displays
The first issue of the new IEEE OPEN JOURNAL ON IMMERSIVE DISPLAYS is expected to be launched in January 2024.
The IEEE Open Journal on Immersive Displays (OJ-ID) is gold open-access, fully electronic scientific journal publishing papers in immersive display science and applications. Immersive display technology is expected to explode with emergence of the massively-disruptive Web 3.0, where decentralization, trustless and permissionless access, artificial intelligence (AI) and machine learning, and connectivity and ubiquity, are expected to be characteristic attributes. Immersive displays are expected to be a critical interface fueling this development, just as smartphones, mobile WiFi, and social networks drove the exponential growth of Web 2.0.
The field of immersive displays is diverse, ranging from the science and engineering of materials and devices to their application in high definition, form-factor-independent displays featuring interactivity, virtual and augmented reality, and 3D content. Submissions on advanced fabrication processing, thin film active and passive devices, and lifetime and reliability evaluation will be welcomed when display is the focus or where there is a direct relationship to the nature of the display system. Tutorial and review papers extending the frontiers of immersive display technologies and novel applications will also be published. And, occasionally special issues with a collection of papers on particular areas in more depth and breadth will also be considered. OJ-ID will publish all papers that are judged to be technically valid and original, providing a home for articles ranging from letters to full-length articles covering newly emerging and rapidly expanding areas in display technology. Decisions will be made fast targeting less than a week for letters and six weeks for full-length articles with publication on-line immediately after acceptance. All research papers will benefit from rapid peer review and publication, and are deposited in IEEE Xplore.