Lastest Issue: Table of Contents (TOC)
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- Front cover
- IEEE Transactions on Semiconductor Manufacturing publication information
- Table of contents
- Editorial
- Guest Editorial Special Section on the International Conference on Microelectronic Test Structures (ICMTS)
- Experimental Extraction of Impact of Depletion Capacitance on Low Frequency Noise in Sub-Micron
n MOSFETs With Reverse Body Bias - Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs
- Bipolar Transistor Test Structures for Extracting Minority Carrier Lifetime in IGBTs
- Two Transistors Voltage-Measurement-Based Test Structure for Fast MOSFET Device Mismatch Characterization
- Extracting Voltage Dependence of BTI-induced Degradation Without Temporal Factors by Using BTI-Sensitive and BTI-Insensitive Ring Oscillators
- A Method to Determine the Electret Charge Potential of MEMS Vibrational Energy Harvester Using Pure-White Noise
- An On-Chip Micromachined Test Structure to Study the Tribological Behavior of Deep-RIE MEMS Sidewall Surfaces
- Optimization of Nafion Polymer Electrolyte Membrane Design and Microfabrication
- Conduction and Electric Field Effect in Ultra-Thin Tungsten Films
- Dependability Assessment of Transfer Length Method to Extract the MetalGraphene Contact Resistance
- Measurement and Modeling of Ambient-Air-Induced Degradation in Organic Thin-Film Transistor
- Test Structures for Developing Packaging for Implantable Sensors
- Resistance Measurement Platform for Statistical Analysis of Emerging Memory Materials
- A Simple Model of Capacity Contention During New Product Introductions
- Sensitivity Enhancement of SiO2 Plasma Etching Endpoint Detection Using Modified Gaussian Mixture Model
- Active Learning of Convolutional Neural Network for Cost-Effective Wafer Map Pattern Classification
- Color Difference Detection of Polysilicon Wafers Using Optimized Support Vector Machine by Magnetic Bacteria Optimization Algorithm With Elitist Strategy
- Layout Pattern Synthesis for Lithography Optimizations
- Abnormal Silicon-Germanium (SiGe) Epitaxial Growth in FinFETs
- Investigation of Dye-Sensitized Solar Cell With Photoanode Modified by TiO-ZnO Nanofibers
- Plasma Induced Damage Reduction of Ultra Low-k Dielectric by Using Source Pulsed Plasma Etching for Next BEOL Interconnect Manufacturing
- Performance of Different Front-Opening Unified Pod (FOUP) Moisture Removal Techniques With Local Exhaust Ventilation System
- 2020 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)
- IEEE Transactions on Semiconductor Manufacturing information for authors
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