Transactions on Device and Materials Reliability (T-DMR)

Browse the T-DMR home page on IEEE Xplore

An on-line publication, jointly sponsored by the Electron Devices Society and the Reliability Society, providing leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It will focus on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the manufacture of these devices; and the interfaces and surfaces of these materials.

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Submitting Manuscripts for Possible Publication in T-DMR

All contributed and invited paper submissions to the IEEE Transactions on Device and Materials Reliability must be submitted using IEEE’s web-based ScholarOne Author Submission and Peer Review System.  Manuscripts submitted in any other way will be returned to the sender.

To submit manuscripts using ScholarOne please click here or login to ScholarOne using the box on the right.

All issue topics are carefully chosen through the input of experienced professionals from both academic and industrial sectors. The manuscripts are passed through a special review process to ensure high technical content and that they are of interest to the special issue audience.

T-DMR accepted manuscripts and published issues can be accessed at IEEE Xplore.

For comments, questions and more information on T-DMR, contact the Editor-in-Chief or the EDS Publications Office.