T-SM Table of Contents
Below is the complete Table of Contents for the current edition of T-SM. Click an article title to view within IEEE Xplore.
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- Table of contents
- IEEE Transactions on Semiconductor Manufacturing publication information
- Editorial 2017 Best Paper Award
- Changes in the Editorial Board
- Maximizing Output During Ramp by Integrating Capacity and Velocity
- Just-In-Time Modeling With Variable Shrinkage Based on Gaussian Processes for Semiconductor Manufacturing
- Integrated Variable Importance Assessment in Multi-Stage Processes
- Colloidal Synthesized Cobalt Nanoparticles for Nonvolatile Memory Device Application
- Modeling of Epitaxial Silicon Growth From the DCS-H2-HCl System in a Large Scale CVD Reactor
- Wafer Level Variability Improvement by Spatial Source/Drain Activation and Ion Implantation Super Scan for FinFET Technology
- A Computer Vision-Inspired Deep Learning Architecture for Virtual Metrology Modeling With 2-Dimensional Data
- A Multilevel Zero-Inflated Model for the Study of Copper Hillocks Growth in Integrated Circuits Manufacturing
- Classification of Mixed-Type Defect Patterns in Wafer Bin Maps Using Convolutional Neural Networks
- IEEE Transactions on Semiconductor Manufacturing information for authors