Zakariae Chbili received the B.S. degree in electrical engineering from Sidi Mohamed Ben Abdellah University, Fes, Morocco, in 2007, the M.S. degree in electrical engineering from the Institut National des Sciences Appliquées, Toulouse, France, in 2008, and the Ph.D. degree in electrical and computer engineering from George Mason University. He was with the National Institute of Standard and Technology, Gaithersburg, MD, USA as a Guest Researcher from 2010 to 2015 and with GLOBALFOUNDRIES Inc. from 2015 to 2019 where he managed the Northeast Reliability Labs. Zak is currently with Intel Corporation Folsom CA, as TD CMOS Reliability manager for Optane. His research interests include the reliability of emerging memory devices, reliability of advanced nodes, physics of degradation and breakdown in ultrathin gate oxides, and FinFET self-heating. Zak served as the General Chairman of IIRW 2019, and EDTM 2022 Reliability committee chair.
