Lastest Issue: Table of Contents (TOC)
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- Front Cover
- IEEE Transactions on Device and Materials Reliability Publication Information
- Table of Contents
- Guest Editorial TDMR IIRW Special Section
- Linking the Intrinsic Electrical Response of Ferroelectric Devices to Material Properties by Means of Impedance Spectroscopy
- Plasma Induced Charging Damage Causing MOS Device Reliability Lifetime Degradation Originating From Well Charging of a Technology With Deep Trench Isolation
- Process-Voltage-Temperature Variations Assessment in Energy-Aware Resistive RAM-Based FPGAs
- Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI
- Modeling Analysis of BTI-Driven Degradation of a Ring Oscillator Designed in a 28-nm CMOS Technology
- Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO2Transistors
- Predicting Failure Distributions of SRAM Arrays by Using Extreme Value Statistic, Bit Cell Simulation, and Machine Learning
- Lightweight Read Reference Voltage Calibration Strategy for Improving 3-D TLC NAND Flash Memory Reliability
- Reliability Test of 21% Efficient Flexible Perovskite Solar Cell Under Concave, Convex and Sinusoidal Bending
- SOI FinFET Design Optimization for Radiation Hardening and Performance Enhancement
- Study on Lifetime Modeling of IGBT Modules Considering Electric Frequency Influence Mechanism
- Comparative Analysis of PEDOT and ITO Under Thermal Bending and Cycling Stresses: Implications for Flexible Solar Cells
- Temperature-Dependent Study of Large-Signal Reliability of p-FET-Based Power Amplifier for mmWave Applications
- Investigations on High-Power LEDs and Solder Interconnects in Automotive Application: Part II—Reliability
- Frequency Dependent Degradation and Failure of Flexible a-InGaZnO Thin-Film Transistors Under Dynamic Stretch Stress
- A Method Adopting Aging Corner to Improve the Accuracy of Device Aging Simulation Model
- TechRxiv: Share Your Preprint Research with the World!
- IEEE Transactions on Device and Materials Reliability Information for Authors
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